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IEEE Electron Device Letters > 2017 > 38 > 7 > 952 - 954
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 104 - 111
IEEE Electron Device Letters > 2017 > 38 > 7 > 952 - 954
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 104 - 111