Wyniki wyszukiwania
IEEE Transactions on Power Electronics > 2018 > 33 > 2 > 926 - 931
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 23 - 36
IEEE Electron Device Letters > 2018 > 39 > 1 > 143 - 146
IEEE Electron Device Letters > 2018 > 39 > 1 > 59 - 62
IEEE Electron Device Letters > 2018 > 39 > 1 > 67 - 70
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 31 - 37
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 19 - 22
IEEE Transactions on Power Electronics > 2018 > 33 > 1 > 581 - 594
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 692 - 697
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5181 - 5187
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3291 - 3301
IEEE Transactions on Power Electronics > 2017 > 32 > 12 > 9342 - 9354
IEEE Electron Device Letters > 2017 > 38 > 11 > 1563 - 1566
TENCON 2017 - 2017 IEEE Region 10 Conference > 488 - 493
IEEE Electron Device Letters > 2017 > 38 > 11 > 1559 - 1562
IEEE Transactions on Nanotechnology > 2017 > 16 > 6 > 999 - 1003
TENCON 2017 - 2017 IEEE Region 10 Conference > 207 - 212
IEEE Transactions on Industry Applications > 2017 > 53 > 6 > 5972 - 5977