Wyniki wyszukiwania
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4386 - 4392
IEEE Transactions on Dielectrics and Electrical Insulation > 2017 > 24 > 5 > 3099 - 3112
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 10 > 1721 - 1728
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4018 - 4024
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 585 - 592
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3132 - 3138
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2478 - 2484
IEEE Transactions on Industrial Electronics > 2017 > 64 > 1 > 883 - 894
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4913 - 4918
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3944 - 3949
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 347 - 352
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3642 - 3648
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2016 > 6 > 7 > 995 - 1001
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2016 > 6 > 7 > 1009 - 1019
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2268 - 2274
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2367 - 2373
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2391 - 2397
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1899 - 1903
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1853 - 1860
IEEE Electron Device Letters > 2016 > 37 > 5 > 611 - 614