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IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 4 > 589 - 598
IEEE Electron Device Letters > 2012 > 33 > 9 > 1252 - 1254
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2974 - 2980
IEEE Electron Device Letters > 2009 > 30 > 9 > 937 - 939