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IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4386 - 4392
IEEE Transactions on Dielectrics and Electrical Insulation > 2017 > 24 > 5 > 3099 - 3112
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3616 - 3621
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3639 - 3646
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3132 - 3138
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 3 > 902 - 909
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 324 - 330
IEEE Electron Device Letters > 2017 > 38 > 5 > 604 - 606
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 163 - 169
IEEE Transactions on Dielectrics and Electrical Insulation > 2017 > 24 > 1 > 437 - 454
IEEE Electron Device Letters > 2017 > 38 > 1 > 99 - 102
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4860 - 4864
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3944 - 3949
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3605 - 3613
IEEE Journal of Photovoltaics > 2016 > 6 > 5 > 1333 - 1338
IEEE Transactions on Dielectrics and Electrical Insulation > 2016 > 23 > 4 > 2311 - 2318
IEEE Electrical Insulation Magazine > 2016 > 32 > 4 > 38 - 42
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2268 - 2274
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2384 - 2390
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 4 > 1 - 4