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Metrology and Measurement Systems > 2021 > Vol. 28, nr 3 > 539--549
Przegląd Elektrotechniczny > 2020 > R. 96, nr 12 > 115--118
Science China Information Sciences > 2019 > 62 > 6 > 1-11
Metrology and Measurement Systems > 2019 > Vol. 26, nr 4 > 631--643
Analog Integrated Circuits and Signal Processing > 2019 > 99 > 2 > 277-285
Nuclear Science and Techniques > 2018 > 29 > 4 > 1-10
IEEE Transactions on Circuits and Systems II: Express Briefs > 2018 > 65 > 1 > 96 - 100
Microelectronics Reliability > 2018 > 80 > C > 91-99
Metrology and Measurement Systems > 2018 > Vol. 25, nr 2 > 269--282
Analog Integrated Circuits and Signal Processing > 2018 > 94 > 2 > 277-287
IET Circuits, Devices & Systems > 2017 > 11 > 6 > 676 - 681
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 11 > 2821 - 2834
Analog Integrated Circuits and Signal Processing > 2018 > 94 > 3 > 357-367
Measurement > 2017 > 108 > C > 48-54