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Nuclear Science and Techniques > 2019 > 30 > 10 > 1-8
Nuclear Science and Techniques > 2019 > 30 > 3 > 1-8
Microelectronics Reliability > 2017 > 78 > C > 349-354
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 332 - 337
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2703 - 2708
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2570 - 2577
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2725 - 2731
IEEE Transactions on Nuclear Science > 2014 > 61 > 5-2 > 2711 - 2717
IEEE Transactions on Nuclear Science > 2014 > 61 > 5-2 > 2694 - 2701
IEEE Transactions on Nuclear Science > 2013 > 60 > 4-1 > 2782 - 2788
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 445 - 454
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2936 - 2944
Science China Information Sciences > 2012 > 55 > 4 > 971-982
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3443 - 3449
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3148 - 3153
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3234 - 3238
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3366 - 3372