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This paper explores the effectiveness of error detection schemes in increasingly multiple-cell upset-dominant technologies, specifically SRAM. A review of interleaving distance, parity codes, and well-taps is conducted to examine each attribute. Then, the paper proposes a novel error detection scheme with the harmonious use of the multiple-cell upset inhibition effects of well-taps, the detectability...
Davydov and Tombak have designed an excellent single error correction-double error detection (SEC-DED) code that appears to be more capable of detecting triple and quadruple errors than the conventional Hamming SEC-DED codes. These codes have been applied to memory subsystems and digital storage devices in order to achieve efficient and reliable data processing and storage. A new approach to soft...
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