Search results
IEEE Transactions on Electromagnetic Compatibility > 2018 > 60 > 1 > 107 - 114
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 616 - 623
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3193 - 3198
2015 IEEE International Reliability Physics Symposium > EL.5.1 - EL.5.5
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 388 - 397
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 4 > 589 - 598
IEEE Transactions on Microwave Theory and Techniques > 2011 > 59 > 2 > 360 - 367
IEEE Electron Device Letters > 2011 > 32 > 9 > 1200 - 1202
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2061 - 2071
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2974 - 2980
Superlattices and Microstructures > 2010 > 48 > 1 > 23-30
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2243 - 2250
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2235 - 2242
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 10 > 3418 - 3426