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HALT, Highly Accelerated Life Test, is a process used to discover product weakness and design margins. Used on printed circuit board assemblies (PCBAs) or product modules, it consists of a series of environmental stresses applied to the product in increasing levels of stress, until the product malfunctions or fails. HALT typically utilizes stresses well beyond the product specifications in order to...
Switched mode power supplies have become ubiquitous in electronic modules and systems. From converting power types, power levels, or driving actuators, these power converters embody varying topologies but usually have high switching rates of up to 500 kHz, power devices such as MOSFETs, microelectronic components and a mix of passive components that store and release energy. They are complex modules...
In 2010, IPC released 9592A, “Performance Parameters for Power Conversion Devices”. The standard includes descriptions of Highly Accelerated Stress Screening (HASS) and Highly Accelerated Stress Audits (HASA) for PCD (Power Conversion Device) ESS, and describes them as more effective than Burn-In. A case study comparing the effectiveness of Burn In with Highly Accelerated Stress Audits (HASA) has...
This paper presents the design, test, and results of a highly accelerated life test (HALT) evaluation of a soft-core called Solder Joint Built-in Self-Test™ (SJ BIST™), a method for detecting faults caused by solder-joint fractures in monitored input/output (I/O) pins of field programmable gate array (FPGA) devices, especially those in ball grid array (BGA) type of packages. Modern electronics utilize...
Today's consumer electronics market becomes highly competitive because of the increase on number of manufacturers and high consumer expectations. These competition causes dramatic cost decreasing. Each cost down work could cause very crucial reliability problems if it is not managed well. Also, consumers' expectations about reliability of the products are increased. Reliable, trouble-free and robust...
The highly accelerated life test (HALT) has been widely used in the industry to evaluate the reliability and qualification of electronic products. However, no lifetime prediction of product will result from this method and it is merely an index of product quality. In this paper, several procedures have been proposed to improve the HALT in order to provide life-time prediction of products. For the...
Typically, in the microstructure of X7R dielectrics, a certain amount of grains with core-shell structure are required to achieve acceptable temperature dependence of capacitance. However, as the thickness of the dielectric layers is reduced, it is increasingly difficult to maintain the core-shell structure in the thin dielectric layers while still achieving both, high capacitance and good reliability...
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