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Keywords

• BICMOS INTEGRATED CIRCUITS (2)
• BICMOS INTEGRATED CIRCUITS TECHNOLOGY (2)
• BICMOS TECHNOLOGY (2)
• COMPLEMENTARY DOUBLE GATE OXIDE MOS TRANSISTOR (2)
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• HETEROJUNCTION BIPOLAR TRANSISTOR (HBT) (2)
• HETEROJUNCTION BIPOLAR TRANSISTORS (2)
• HIGH-LINEARITY MIM CAPACITOR (2)
• INTEGRATED CIRCUIT FABRICATION (2)
• LOGIC GATES (2)
• MILLIMETER WAVE TECHNOLOGY (2)
• MIM DEVICES (2)
• SIGE (2)
• SILICON GERMANIUM (2)
• SILICON GERMANIUM (SIGE) (2)
• SIZE 0.13 MUM (2)
• BICMOS ANALOGUE INTEGRATED CIRCUITS (1)
• BIPOLAR MIMIC (1)
• CMOS INTEGRATED CIRCUITS (1)
• CMOS TECHNOLOGY (1)
• COPPER (1)
• CURRENT MEASUREMENT (1)
• DEVICE RELIABILITY (1)
• HBT (1)
• HIGH PERFORMANCE TRANSMISSION LINE (1)
• HIGH-SPEED MEDIUM VOLTAGE HBT (1)
• INDUCTORS (1)
• MILLIMETER-WAVE APPLICATIONS (1)
• MILLIMETRE WAVE BIPOLAR TRANSISTORS (1)
• MILLIMETRE WAVE FIELD EFFECT TRANSISTORS (1)
• MILLIMETRE-WAVE APPLICATIONS (1)
• MIMIC (1)
• MOS CAPACITORS (1)
• MOSFET (1)
• NOISE (1)
• SEMICONDUCTOR DEVICE MODELS (1)
• SEMICONDUCTOR DEVICE RELIABILITY (1)
• STRESS (1)
• THICK-COPPER BACK-END DESIGN (1)
• TRANSMISSION LINES (1)
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