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2011 International Reliability Physics Symposium > 6B.5.1 - 6B.5.5
Microelectronic Engineering > 2008 > 85 > 8 > 1736-1738
2008 2nd IEEE International Nanoelectronics Conference > 1020 - 1022
Thin Solid Films > 1996 > 284-285 > 474-476