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Microelectronics Reliability > 2014 > 54 > 11 > 2613-2620
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1045 - 1053
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2002 > 10 > 4 > 469 - 476
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2002 > 10 > 3 > 221 - 229