Search results
Nanoscale Research Letters > 2019 > 14 > 1 > 1-6
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3734 - 3739
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3287 - 3292
IEEE Electron Device Letters > 2017 > 38 > 7 > 937 - 940
IEEE Electron Device Letters > 2017 > 38 > 1 > 95 - 98
IEEE Electron Device Letters > 2016 > 37 > 5 > 545 - 548
Microelectronics Reliability > 2016 > 56 > C > 37-44
IEEE Electron Device Letters > 2015 > 36 > 8 > 760 - 762
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 7 > 1977 - 1986
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 366 - 373
Journal of Electronic Materials > 2015 > 44 > 12 > 4700-4705
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2785 - 2792
IEEE Electron Device Letters > 2014 > 35 > 3 > 327 - 329
IEEE Electron Device Letters > 2013 > 34 > 12 > 1494 - 1496
IEEE Electron Device Letters > 2013 > 34 > 9 > 1115 - 1117
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3190 - 3196
IEEE Electron Device Letters > 2013 > 34 > 9 > 1118 - 1120