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IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3588 - 3594
Solid-State Electronics > 2017 > 135 > C > 65-70
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2782 - 2788
IEEE Transactions on Nuclear Science > 2017 > 64 > 3 > 976 - 982
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 674 - 691
IEEE Transactions on Nuclear Science > 2017 > 64 > 6-2 > 1549 - 1553
IEEE Transactions on Plasma Science > 2016 > 44 > 10-1 > 2053 - 2059
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3445 - 3450
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 419 - 428
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2242 - 2247
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1953 - 1957
IEEE Electron Device Letters > 2015 > 36 > 1 > 11 - 13
IEEE Transactions on Power Electronics > 2014 > 29 > 5 > 2482 - 2491