Search results
Thin Solid Films > 2014 > 562 > C > 597-602
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2979 - 2986
IEEE Transactions on Electron Devices > 2012 > 59 > 5 > 1501 - 1509
2011 International Reliability Physics Symposium > 2E.2.1 - 2E.2.8
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2911 - 2917
Thin Solid Films > 2003 > 427 > 1-2 > 350-354
Solid State Electronics > 2002 > 46 > 4 > 459-466