Search results
Journal of Electronic Testing > 2012 > 28 > 5 > 723-731
2010 International Electron Devices Meeting > 27.2.1 - 27.2.4
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2009 > 28 > 5 > 769 - 773
2007 IEEE International Electron Devices Meeting > 1038 - 1040