Search results
Journal of Electronic Testing > 2018 > 34 > 6 > 735-747
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 3120 - 3123
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 5 > 689 - 696
Journal of Electronic Testing > 2018 > 34 > 6 > 735-747
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 3120 - 3123
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 5 > 689 - 696