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IEEE Journal of Selected Topics in Quantum Electronics > 2017 > 23 > 6 > 1 - 7
Hyperfine Interactions > 2017 > 238 > 1 > 1-9
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4167 - 4174
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3713 - 3718
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3515 - 3518
Journal of Membrane Science > 2017 > 525 > C > 48-56
IEEE Electron Device Letters > 2017 > 38 > 2 > 248 - 251
Surface and Coatings Technology > 2016 > 307 > PB > 1112-1118
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2442 - 2448
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > Characterization and Simulation of SOI Devices Operating under Harsh Environment > 247-254
IEEE Journal of Solid-State Circuits > 2016 > 51 > 1 > 213 - 221
IEEE Journal of Solid-State Circuits > 2014 > 49 > 1 > 154 - 166
Journal of Electronic Materials > 2014 > 43 > 6 > 2397-2404
IEEE Electron Device Letters > 2013 > 34 > 9 > 1175 - 1177
IEEE Transactions on Electron Devices > 2012 > 59 > 9 > 2424 - 2429
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2012 > 2 > 2 > 208 - 216
Journal of Power Sources > 2011 > 196 > 11 > 4905-4910
IEEE Journal of Selected Topics in Quantum Electronics > 2011 > 17 > 6 > 1727 - 1734
Electrochimica Acta > 2010 > 55 > 28 > 8371-8375