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2010 IEEE International Reliability Physics Symposium > 1105 - 1114
IEEE Transactions on Electron Devices > 2009 > 56 > 2 > 236 - 242
2010 IEEE International Reliability Physics Symposium > 1105 - 1114
IEEE Transactions on Electron Devices > 2009 > 56 > 2 > 236 - 242