Search results
Journal of Lightwave Technology > 2017 > 35 > 10 > 1971 - 1979
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2298 - 2305
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 138 - 145
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1209 - 1216
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 832 - 839
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1853 - 1860
IEEE Transactions on Plasma Science > 2016 > 44 > 10-1 > 2079 - 2083
Journal of Lightwave Technology > 2015 > 33 > 20 > 4261 - 4267
Journal of Lightwave Technology > 2015 > 33 > 15 > 3215 - 3223
IEEE Electrical Insulation Magazine > 2015 > 31 > 3 > 32 - 42
IEEE Latin America Transactions > 2015 > 13 > 2 > 469 - 475
IEEE Transactions on Dielectrics and Electrical Insulation > 2014 > 21 > 2 > 563 - 570
IEEE Electrical Insulation Magazine > 2013 > 29 > 6 > 29 - 36
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3071 - 3078
IEEE Electron Device Letters > 2012 > 33 > 7 > 1036 - 1038
IEEE Electron Device Letters > 2012 > 33 > 7 > 961 - 963
IEEE Transactions on Dielectrics and Electrical Insulation > 2012 > 19 > 1 > 343 - 351
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 933 - 940
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 672 - 676
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1134 - 1140