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2015 IEEE International Reliability Physics Symposium > 3D.2.1 - 3D.2.6
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 2 > 280 - 291
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 12 > 2738 - 2751
2012 IEEE International Reliability Physics Symposium (IRPS) > 4C.1.1 - 4C.1.8
IEEE Journal of Solid-State Circuits > 2011 > 46 > 10 > 2374 - 2385
2010 Proceedings of ESSCIRC > 410 - 413
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 305 - 310