Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4861 - 4867
IEEE Transactions on Computers > 2017 > 66 > 3 > 553 - 559
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 12 > 2738 - 2751
2013 IEEE International Reliability Physics Symposium (IRPS) > 2A.5.1 - 2A.5.6
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 458 - 465
IEEE Transactions on Reliability > 2010 > 59 > 2 > 319 - 330
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 2 > 173 - 183
2008 Congress on Image and Signal Processing > 1 > 85 - 89
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2006 > 14 > 5 > 441 - 451