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IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 204 - 211
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 9 > 1645 - 1655
2011 International Reliability Physics Symposium > 2B.4.1 - 2B.4.4
2010 International Electron Devices Meeting > 4.2.1 - 4.2.4
2009 IEEE 8th International Conference on ASIC > 581 - 584
2009 IEEE Custom Integrated Circuits Conference > 431 - 438