The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The characterization of concentration modules based on Fresnel lens performed in outdoor conditions is presented. Two different types of high concentration photovoltaic modules with point focusing silicone on glass Fresnel lenses as optical concentration element are characterized in order to make a comparison between them. Main differences between the two modules are represented by the number of multijunction...
Formation of cracks is a major cause of damage in reinforced concrete (RC) structures which adversely affects the durability along-with appearance of structures. Hence, to understand the behavior of RC structural element under different stresses, it is necessary to obtain significant data describing the characteristics of fracture such as types of cracks, its propagation, failure pattern etc. which...
In the state of the art development of chip manufacturing (FinFet technology for example) both optical inspection and inline electrical test are deployed to monitor and facilitate the process development. While optical inspection provides critical process evaluation at the sector inline electrical test (ILT) at M1 provides the information of process impact on the electrical signal, which ultimately...
The development of antennas for RFID tags requires measurement of the parameters; as well as, the response of these to be questioned by a reader, the variation of the parameters with simulation tools and building prototypes of antennas can be evaluated, compared, and verified to determine whether the label complies with the basic requirements. To do this, it requires a methodology to help determine...
This chapter contains sections titled:
Introduction
Preparation Methods of Novel Quick Dissolving Films
Polymers and Blends for Utilization in Different Quick Dissolving Films
Polymers in Novel Quick Dissolving Films
Role of Plasticizers in Novel Quick Dissolving Film
Characterization Procedure Listed in the Literature for Fast Dissolving Films
Conclusion and Future Perspectives
In this work, we demonstrated a simple method to test the point contact design and determine the Surface Recombination Velocity (SRV) of the point contact solar cells from a single PL image. The thermally grown silicon dioxide is patterned by using lithographic means. The size, pitch and pattern of the point contact opening holes are varied in order to find the relationship between opening density...
A TSV in a 3D IC could suffer from two major types of parametric faults — a resistive open fault, or a leakage fault. Dealing with these parametric faults (which do not destroy the functionality of a TSV completely but only degrade its quality or performance) is often trickier than dealing with a stuck-at fault. Previous works have not proposed a unified test structure and method that can characterize...
The field of photovoltaic (silicon solar cells) is an important driver for regenerative energy techniques. The technology and efforts regarding efficiency factor, quality, and costs are still under development. Currently, typical silicon solar cells are connected to so called strings by two or three solder coated copper ribbons. The common interconnection technology of silicon solar cells is soldering...
This paper presents the results obtained testing a tool designed to characterize and simulate the behavior of a Photovoltaic (PV) panel under real and/or simulated working conditions. The presented tool permits the continuous monitoring of the I-V (Current-Voltage) and P-V (Power-Voltage) characteristics of the panel and the comparison between actual and expected performance; in this way it is possible...
Magnetic Random Access Memory (MRAM) is a non-volatile memory which is widely studied for its high speed, high density, small cell size, and almost unlimited endurance. However, for deep-submicron process technologies, significant variation in MRAM cells' operating regions results in write failures in cells and reduces the production yield. Currently, memory designers characterize failed MRAM chips...
Characterization provides electrical values for all parameters of the data sheet. Modern DRAMs have increasing numbers of operation modes resulting in ever larger numbers of characterization test items and larger numbers of test patterns. Test time is not only determined by the number of test items, but also by the search algorithm. Binary search can speed up single device measurements, but is difficult...
In this paper, we propose a new technique, referred to as virtual probe (VP), to efficiently measure, characterize and monitor both inter-die and spatially-correlated intra-die variations in nanoscale manufacturing process. VP exploits recent breakthroughs in compressed sensing to accurately predict spatial variations from an exceptionally small set of measurement data, thereby reducing the cost of...
Parallel testing of mixed-signal circuits has been considered a difficult task due to the limited resources in generating and analyzing multiple analog signals. A number of methods have been proposed to perform parallel testing of mixed-signal circuits using built-in test circuitry; however, these techniques are vulnerable to fault masking issues which may degrade the test accuracy. This paper presents...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.