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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3138 - 3151
2012 IEEE International Reliability Physics Symposium (IRPS) > 2B.3.1 - 2B.3.5
IEEE Electron Device Letters > 2009 > 30 > 9 > 972 - 974
Ieee transactions on components and packaging technologies > 2008 > 31 > 1 > 135 - 142
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1786 - 1790