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2015 IEEE International Reliability Physics Symposium > 5B.6.1 - 5B.6.6
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3561 - 3567
IEEE Electron Device Letters > 2012 > 33 > 9 > 1267 - 1269
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3635 - 3638
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2307 - 2313
IEEE Electron Device Letters > 2007 > 28 > 10 > 871 - 873