The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Electrostatic discharge (ESD) is a well-known problem in integrated circuits that affect its reliability, yield and cost. It is important to design ESD protection circuits that are able to prevent ESD related yield loss [1]. In this work, a 65 nm hybrid clamp that combines static and transient clamps is presented. A NMOS based ESD clamp with level converter delay is used as a transient clamp, while...
This paper investigates the influences of the temperature and the trigger parameters (width and rise time) on the threshold of transient latch-up (TLU). It is shown that temperature is a much more critical parameter than transient trigger parameters. For high discharge currents which are typical for system level surges as e.g. cable discharge events, even very short trigger pulses can cause TLU.
Clamp type transient suppressors are widely used to protect electronic equipment from damage during short periods of abnormal voltage on supply lines. However, the action of these suppressors, in conjunction with stray circuit elements, can induce secondary transient effects which may also disrupt equipment operation. This paper discusses the nature and origin of these secondary effects, and provides...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.