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The Multi-Domain-Test is the new test strategy to resolve problems and limitations of the Multi-Site-Test and the Concurrent-Test. By this novel test strategy, test time can be reduced down to 50% of the Single-Site-Test with almost the same amount of tester resources. Cost Of Test (COT) can be lower than the Multi-Site-Test that is well used at productions.
We will demonstrate the effectiveness of power supply active compensation techniques in mixed signal device performance testing. Read channel speed sorting for data storage SOCs is used to illustrate how we minimize the power transient effect in ATE test, where read-channel current draw varies drastically between different mission-modes and power-saving-modes. These active compensation ideas are critical...
Summary form only given. Test cost is becoming increasingly significant percentage of COB (Cost of Build) in current SoCs (System-on-a-Chip). This is even critical in low cost markets like consumer devices. This session outlines test cost reduction strategy that can be adopted on a typical SoC. Strategy exploits known test cost reduction techniques that include DFT (Design-For-Test) techniques, target...
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