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Microelectronics Reliability > 2017 > 78 > C > 118-125
Microelectronics Reliability > 2014 > 54 > 9-10 > 1702-1706
IEEE Transactions on Semiconductor Manufacturing > 2011 > 24 > 1 > 89 - 92
Computational Materials Science > 2010 > 49 > 4 Supplement > S235-S238
Physical Mesomechanics > 2008 > 11 > 3-4 > 158-186
30th Annual Proceedings Reliability Physics 1992 > 211 - 216