Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1032 - 1037
IEEE Electron Device Letters > 2017 > 38 > 1 > 99 - 102
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 667 - 684
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 3 > 756 - 766
2015 IEEE International Reliability Physics Symposium > 6C.1.1 - 6C.1.6
2015 IEEE International Reliability Physics Symposium > 6C.3.1 - 6C.3.4
2015 IEEE International Reliability Physics Symposium > 2E.5.1 - 2E.5.8
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 840 - 846
2012 IEEE International Reliability Physics Symposium (IRPS) > CD.6.1 - CD.6.5
IEEE Transactions on Electron Devices > 2012 > 59 > 8 > 2123 - 2128
TENCON 2011 - 2011 IEEE Region 10 Conference > 1356 - 1360
2011 International Reliability Physics Symposium > 4E.3.1 - 4E.3.4
2011 International Reliability Physics Symposium > CD.2.1 - CD.2.5
2010 International Electron Devices Meeting > 20.3.1 - 20.3.4
IEEE Electron Device Letters > 2010 > 31 > 7 > 662 - 664