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IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1499 - 1507
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1091 - 1095
IEEE Electron Device Letters > 2011 > 32 > 4 > 482 - 484
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 187 - 193
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 473 - 479
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2353 - 2357
IEEE Electron Device Letters > 2010 > 31 > 4 > 302 - 304
IEEE Electron Device Letters > 2010 > 31 > 6 > 561 - 563
IEEE Electron Device Letters > 2010 > 31 > 3 > 195 - 197
IEEE Electron Device Letters > 2009 > 30 > 8 > 796 - 798
IEEE Electron Device Letters > 2009 > 30 > 9 > 904 - 906
IEEE Transactions on Microwave Theory and Techniques > 2008 > 56 > 12-2 > 3188 - 3192
IEEE Transactions on Electron Devices > 2007 > 54 > 10 > 2589 - 2597
IEEE Electron Device Letters > 2007 > 28 > 8 > 676 - 678
IEEE Transactions on Electron Devices > 2007 > 54 > 10 > 2614 - 2622