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IEEE Electron Device Letters > 2017 > 38 > 12 > 1704 - 1707
2012 IEEE International Reliability Physics Symposium (IRPS) > 2C.4.1 - 2C.4.6
IEEE Electron Device Letters > 2011 > 32 > 5 > 620 - 622
IEEE Transactions on Electron Devices > 2010 > 57 > 4 > 952 - 955
2008 International Semiconductor Conference > 1 > 43 - 52
IEEE Transactions on Microwave Theory and Techniques > 2008 > 56 > 12-2 > 3188 - 3192