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This paper describes a non-binary SAR ADC architecture that is reconfigurable at production testing time to increase the number of chips that meet a given sampling speed specification, i.e. to improve yield. A non-binary SAR ADC can realize higher sampling rates than a comparable conventional binary SAR ADC, by using overlapping SA ranges so that any errors due to incomplete settling of the internal...
In this paper, the automatic detection of defects in the stitchwork was studied. The defects were arranged in two groups, the defects on the seam and the defects on the cloth. Based on image processing principle, image preprocessing and segmentation of the two types of defects were introduced. The image texture characteristic parameters can be used to classify the defects. The characteristic parameters...
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