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IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 223 - 230
IEEE Transactions on Plasma Science > 2017 > 45 > 12-2 > 3349 - 3355
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5128 - 5133
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5147 - 5150
IEEE Transactions on Plasma Science > 2017 > 45 > 12-2 > 3202 - 3208
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 773 - 779
IEEE Transactions on Plasma Science > 2017 > 45 > 12-2 > 3195 - 3201
IEEE Transactions on Nuclear Science > 2017 > 64 > 11 > 2883 - 2890
IEEE Transactions on Plasma Science > 2017 > 45 > 11 > 2962 - 2973
IEEE Transactions on Plasma Science > 2017 > 45 > 11 > 3046 - 3053
IET Micro & Nano Letters > 2017 > 12 > 11 > 897 - 900
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4594 - 4598
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4671 - 4677
Proceedings of the IEEE > 2017 > 105 > 11 > 2166 - 2190
2017 IEEE SENSORS > 1 - 3
2017 47th European Microwave Conference (EuMC) > 672 - 675
2017 47th European Microwave Conference (EuMC) > 676 - 679