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The study of mRNA methylation is an emerging research field greatly fueled by recent advancement in high throughput sequencing technology. We propose here a binomial likelihood ratio test ("bltest") aiming at detecting differentially methylated mRNA with MeRIP-Seq data, "bltest" models the read counts of each RNA methylation site in IP and input samples with a binomial distribution...
The new method of one-factor analysis of variance for medical statistical data with binomial distribution is studied in this paper. The total probability variation of the control groups is decomposed into sample probability variation and probability variation between samples in control groups, the statistical analysis will be done to the data with binomial distribution by using one-factor analysis...
Binomial distribution is very useful in wide fields. And the truncated sequential test theory for the simple null hypothesis vs simple alternative hypothesis is the basis in binomial distribution sequential analysis. In this paper we have defined precise definitions of truncated sequential test of binomial distribution, such as, optimum truncated sequential test, uniformly optimum truncated sequential...
The V-ramp test is an important test for GOI (gate oxide integrity) of MOS devices. The criterion for a product under GOI qualification is to meet the requirement with defect density lower than a target defect density (D0). This paper studies the methods and guidelines in minimum sample size determination provided by JEDEC/FSA joint publication and points out their drawbacks, inconsistency, and misguidance...
The probabilistic diagnosis model is useful in many fields such as distributed network, digital system level testing, wafer fault testing. Some topologies and continuous defect units distributions are studied in the previous work. In this paper, we extend the model to arbitrary topology structure with share nodes and to the discrete defect distributions, such as Poission distribution and binomial...
This paper presents results of an analysis of the sequential test (ST) procedures described in MIL-HDBK-781A, and IEC 61124, intended for checking the mean Time Between Failures (TBF) value under an exponential distribution of the TBF. The methodological basis of the calculations consists in discretization of the ST process through subdivision of the time axis in small segments. By this means, the...
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