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IEEE Electron Device Letters > 2011 > 32 > 6 > 707 - 709
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 147 - 162
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 79 - 97
IEEE Electron Device Letters > 2011 > 32 > 6 > 707 - 709
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 147 - 162
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 79 - 97