Search results
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 45 - 50
IEEE Electron Device Letters > 2017 > 38 > 10 > 1445 - 1448
IEEE Electron Device Letters > 2017 > 38 > 6 > 779 - 782
IEEE Electron Device Letters > 2016 > 37 > 11 > 1407 - 1410
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 776 - 781
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1341 - 1346
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3099 - 3104
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3012 - 3018
IEEE Electron Device Letters > 2013 > 34 > 2 > 217 - 219
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 213 - 220
IEEE Electron Device Letters > 2012 > 33 > 9 > 1258 - 1260
IEEE Electron Device Letters > 2012 > 33 > 10 > 1372 - 1374
IEEE Electron Device Letters > 2012 > 33 > 1 > 44 - 46
IEEE Electron Device Letters > 2012 > 33 > 7 > 961 - 963
IEEE Electron Device Letters > 2011 > 32 > 3 > 297 - 299
IEEE Electron Device Letters > 2011 > 32 > 2 > 134 - 136
IEEE Electron Device Letters > 2011 > 32 > 5 > 617 - 619
IEEE Electron Device Letters > 2011 > 32 > 8 > 1056 - 1058
IEEE Electron Device Letters > 2011 > 32 > 12 > 1683 - 1685
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2579 - 2586