Search results
IEEE Transactions on Control Systems Technology > 2018 > 26 > 1 > 89 - 101
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 5 > 1613 - 1624
IEEE Journal of Emerging and Selected Topics in Power Electronics > 2017 > 5 > 3 > 1045 - 1054
IEEE Journal of Photovoltaics > 2017 > 7 > 5 > 1362 - 1375
IEEE Journal of the Electron Devices Society > 2017 > 5 > 5 > 372 - 377
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 8 > 2271 - 2284
IEEE Design & Test > 2017 > 34 > 3 > 59 - 67
IEEE Transactions on Antennas and Propagation > 2017 > 65 > 6 > 2855 - 2864
IEEE Transactions on Industrial Electronics > 2017 > 64 > 6 > 4885 - 4893
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 404 - 413
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 307 - 315
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1591 - 1596
IEEE Electron Device Letters > 2017 > 38 > 4 > 430 - 433
IEEE Transactions on Neural Networks and Learning Systems > 2017 > 28 > 3 > 523 - 533
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 52 - 58
IEEE Journal of Solid-State Circuits > 2017 > 52 > 2 > 528 - 542
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 512 - 518
IEEE Transactions on Industrial Electronics > 2017 > 64 > 1 > 605 - 614
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 1 > 286 - 293
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 5068 - 5071