Search results
IEEE Transactions on Applied Superconductivity > 2018 > 28 > 3 > 1 - 5
IEEE Transactions on Industrial Electronics > 2017 > 64 > 12 > 9469 - 9476
IEEE Electron Device Letters > 2017 > 38 > 11 > 1579 - 1582
IEEE Transactions on Applied Superconductivity > 2017 > 27 > 4-3 > 1 - 5
IEEE Transactions on Applied Superconductivity > 2017 > 27 > 4-3 > 1 - 3
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1372 - 1378
IEEE Transactions on Applied Superconductivity > 2017 > 27 > 4-3 > 1 - 4
IEEE Transactions on Applied Superconductivity > 2017 > 27 > 4-3 > 1 - 5
IEEE Transactions on Applied Superconductivity > 2017 > 27 > 4-2 > 1 - 5
IEEE Transactions on Magnetics > 2017 > 53 > 6 > 1 - 4
IEEE Transactions on Applied Superconductivity > 2017 > 27 > 4-2 > 1 - 6
IEEE Transactions on Applied Superconductivity > 2017 > 27 > 4-3 > 1 - 4
IEEE Transactions on Applied Superconductivity > 2017 > 27 > 4-2 > 1 - 5
IEEE Transactions on Applied Superconductivity > 2017 > 27 > 4-3 > 1 - 5
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 170 - 175
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 1 > 217 - 227
IEEE Transactions on Applied Superconductivity > 2017 > 27 > 1 > 1 - 6
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 293 - 299
IEEE Microwave and Wireless Components Letters > 2017 > 27 > 1 > 91 - 93
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 7 > 1 - 5