Wyniki wyszukiwania
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 50 - 62
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4492 - 4495
IEEE Transactions on Magnetics > 2017 > 53 > 11 > 1 - 4
IEEE Transactions on Magnetics > 2017 > 53 > 11 > 1 - 4
IEEE Transactions on Magnetics > 2017 > 53 > 11 > 1 - 5
IEEE Transactions on Magnetics > 2017 > 53 > 11 > 1 - 4
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4295 - 4301
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4084 - 4090
IEEE Transactions on Magnetics > 2017 > 53 > 10 > 1 - 6
IEEE Transactions on Magnetics > 2017 > 53 > 10 > 1 - 13
IEEE Transactions on Magnetics > 2017 > 53 > 9 > 1 - 5
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 7 > 1181 - 1192
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2842 - 2848
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2835 - 2841
IEEE Transactions on Computers > 2017 > 66 > 5 > 786 - 798
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1421 - 1432
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1573 - 1577
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 4 > 847 - 857
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1204 - 1214
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 213 - 220