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IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2092 - 2098
2017 IEEE International Reliability Physics Symposium (IRPS) > FA-5.1 - FA-5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 31.2.1 - 31.2.4
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-2-1 - 4B-2-7
IEEE Electron Device Letters > 2014 > 35 > 12 > 1179 - 1181
2012 IEEE International Reliability Physics Symposium (IRPS) > 5A.4.1 - 5A.4.6
IEEE Electron Device Letters > 2012 > 33 > 12 > 1681 - 1683
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 219 - 226
2010 International Electron Devices Meeting > 4.1.1 - 4.1.4
IEEE Transactions on Electron Devices > 2009 > 56 > 5 > 1063 - 1069
IEEE Electron Device Letters > 2008 > 29 > 3 > 242 - 245