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IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 455 - 460
IEEE Electron Device Letters > 2016 > 37 > 3 > 242 - 244
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 474 - 477
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 308 - 318
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4166 - 4174
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 161 - 166
2011 International Reliability Physics Symposium > 4E.1.1 - 4E.1.5