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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 2 > 427 - 440
2015 IEEE AUTOTESTCON > 273 - 279
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 66 - 72
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 2 > 427 - 440
2015 IEEE AUTOTESTCON > 273 - 279
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 66 - 72