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In this paper, we introduce a systematic power analysis framework for SoC designs using bottom-up power modeling integrated with top-down power estimation. Four power analysis tools have been realized: (1) PowerBrick, a power characterization tool to construct power libraries for standard cell library and memory compiler, (2) PowerMixer, an RTL/gate-level power estimator for large logic design, (3)...
Scan architectures with compression support have remedied the test time and data volume problems of today's sizable designs. On-chip compression of responses enables the transmission of a reduced volume signature information to the ATE, delivering test data volume savings, while it engenders the challenge of retaining test quality. In particular, unknown bits (x's) in responses corrupt other response...
This paper presents a cross-layer co-design approach to reduce SSD read response latency. The key is to cohesively exploit the NAND flash memory device write speed vs. raw storage reliability trade-off at the physical layer and run-time data access workload variation at the system level. Leveraging run-time data access workload variation, we can opportunistically slow down NAND flash memory write...
This paper presents a new type of a more complete system verification method, which combines a high-level verification methodology based on verification methodology manual (VMM) techniques for functional simulation and system-on-a-programmable-chip (SOPC) techniques for board-level verification, effectively improve the adequacy and reliability of verification and validation efficiency. This paper...
Clock-gating is a well known technique to reduce dynamic power consumption of a hardware design. In any clock-gating based power reduction flow, automatic selection of appropriate registers and/or register banks is extremely time-consuming because power analysis is performed at the RTL or lower level. In a high-level synthesis (HLS) based design flow, to achieve faster design closure, one must be...
This paper presents a comparison between different charge injection induced error models, based on a simple ideal structure, which ignores signal sources output impedance and compares this model's predictions to simulation results of a realistic circuit situation. This comparison gives designers an image of how accurate these models are and how well can they be used in specific design situations....
Continued increase in variability is a challenge for SRAM scaling into sub-22 nm nodes, and presents an opportunity for the introduction of alternate technologies. In this work, the performance and threshold-voltage variability of vertical SOI finFETs are compared against those of planar fully depleted (FD) SOI MOSFETs with thin buried oxide, and are presented as an alternative to planar bulk CMOS...
This paper describes adaptive fine-grain control to power gate function units based on temperature dependent break-even time (BET). An analytical model to express the temperature dependent BET is introduced and the accuracy of the model was examined. Results demonstrated that the model well represents the exponential decrease in BET with the temperature. Meanwhile, it was found that the accuracy gets...
In this paper, the physical constraint effects imposed on the knee voltage along with the variation of optimum load resistance for high efficient Class-F-1 amplifier are analyzed. For the accurate analysis, the new current waveform models are identified, and the realistic approach incorporating with a non-zero knee voltage and a voltage dependent-nonlinear capacitance is employed to derive the voltage...
We present a new ESD compact modeling methodology using Verilog-A to enable predictive full circuit ESD simulation along with supporting hardware and failure analysis results. We also present a new ESD tool (ESTEEM) to automate the ESD design simulation and optimization flow for circuit designers. Test results show excellent simulation to hardware data correlation.
As IC technology scales down, the metal width is decreasing, making the resistance along the power lines increase substantially. Together with the nonlinear scaling of the threshold voltage that makes the ratio of the threshold voltage to the supply voltage rise, the IR drop becomes a serious problem in modern VLSI design. Thus, the verification of the power distribution network is of critical importance...
The design of SOI-based SoCs has traditionally been the province of a few companies that could afford very labor-intensive custom design approaches - microprocessor companies looking for performance or aerospace companies looking for rad-hard electronics. In recent years, SOI has become a more attractive option for SoC design teams that have traditionally targeted bulk silicon. With current improvements...
Multi-gate-length (MGL) and dual-gate-length (DGL) biasing techniques are investigated for timing constraint-aware active mode leakage power reduction of VLSI circuits. Key design and technology characteristics essential for leakage reduction are identified and utilized to carry out a Monte-Carlo-based study to benchmark MGL against DGL over different design styles and various technologies. Extensive...
Transistor variability has emerged as one of the important constraints in Nano-CMOS circuit design. The ever decreasing device feature size with CMOS scaling, has resulted in an increasing uncertainty in predicting the exact device behaviour. The issue of variability needs to be addressed across the entire hierarchy of integrated circuits - optimization of process and device technology to yield minimal...
The proposed methodology encompasses four study phases that address the following key design aspects of integrated power modules (IPM) for voltage regulators: Fundamental switching understanding, determination of compact/accurate loss expressions and derivation of design rules, guidelines and figure of merits for converter optimisation. The applied methods are based on several modelling approaches...
While prior research has extensively evaluated the performance advantage of moving from a 2D to a 3D design style, the impact of process parameter variations on 3D designs has been largely ignored. In this paper, we attempt to bridge this gap by proposing a variability-aware design framework for fully-synchronous (FS) and multiple clock-domain (MCD) 3D systems. First, we develop analytical system-level...
Electronic design automation (EDA) tools have facilitated the design of ever more complex integrated circuits each year. Synthetic biology would also benefit from the development of genetic design automation (GDA) tools. Existing GDA tools require biologists to design genetic circuits at the molecular level, roughly equivalent to designing electronic circuits at the layout level. Analysis of these...
Simultaneous switching noise (SSN) is an important issue for the design and test and actual ICs. In particular, SSN that originates from the internal logic circuitry becomes a serious problem as the speed and density of the internal circuit increase. In this paper, an on-chip monitor is proposed to detect potential logic errors in digital circuits due to the presence of SSN. This monitor checks the...
Recent silicon process technology advancements have given chip designers integration capabilities never were possible before, and have led to a new wave of complex ASICs (applied specific integrated circuits). These advanced processes come with new challenges. This paper presents some of the challenges in deep submicron technologies, which require new design practices. We demonstrate some issues related...
This paper describes a design flow for the circuit-level optimization of a technology. The concurrent exploration of device characteristics and library design choices leads to a more application-optimal technology. We illustrate the design flow by: 1) analyzing the impact of buffer cell design, and 2) by optimizing a 130 nm technology for low operational power.
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