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IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 10 > 1759 - 1763
IEEE Transactions on Industrial Informatics > 2017 > 13 > 4 > 1817 - 1824
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 6 > 1018 - 1029
IEEE Transactions on Industry Applications > 2017 > 53 > 2 > 1704 - 1708
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2300 - 2306
IEEE Journal of Photovoltaics > 2016 > 6 > 6 > 1635 - 1640
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2016 > 6 > 3 > 319 - 329
IEEE Transactions on Vehicular Technology > 2016 > 65 > 6 > 4393 - 4400
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1934 - 1939
IEEE Transactions on Industry Applications > 2016 > 52 > 2 > 1280 - 1284
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 519 - 528
IEEE Photonics Technology Letters > 2015 > 27 > 15 > 1663 - 1666
IEEE Transactions on Reliability > 2015 > 64 > 2 > 603 - 612
IEEE Transactions on Plasma Science > 2015 > 43 > 5-1 > 1474 - 1479
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 5 > 822 - 834
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 3 > 580 - 583
IEEE Transactions on Industry Applications > 2015 > 51 > 2 > 1855 - 1863
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2015 > 5 > 2 > 274 - 278
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2014 > 4 > 2 > 181 - 189
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 203 - 212