Search results
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3227 - 3236
IEEE Design & Test > 2017 > 34 > 5 > 72 - 79
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 5 > 1002 - 1012
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 5 > 1 - 4
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 6 > 1374 - 1384
IEEE Transactions on Automation Science and Engineering > 2016 > 13 > 2 > 1155 - 1164
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 3 > 499 - 512
IEEE Transactions on Nuclear Science > 2016 > 63 > 1-2 > 385 - 391
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 1 > 393 - 397
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1210 - 1220
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 4 > 668 - 681
IEEE Journal of Solid-State Circuits > 2015 > 50 > 1 > 191 - 203
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 11 > 2380 - 2387
IEEE Transactions on Nuclear Science > 2014 > 61 > 2 > 766 - 786
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2014 > 33 > 9 > 1410 - 1423
IEEE Transactions on Nuclear Science > 2014 > 61 > 5-2 > 2694 - 2701
IEEE Transactions on Computers > 2014 > 63 > 2 > 497 - 509
IEEE Transactions on Applied Superconductivity > 2013 > 23 > 3-1 > 1301505
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 12 > 2307 - 2320