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Fast frequency sweep using Model Order Reduction (MORe) techniques is one of the most important features in modern FEM-based simulation software. In fact MORe techniques, and the Well-Conditioned Asymptotic Waveform Evaluation (WCAWE) technique in particular, reduce considerably the simulation time by providing accurate S-parameter approximations over wide frequency ranges with only one complete LU...
Wakeup time is an important overhead that must be determined for effective power gating, particularly in logic clusters that undergo frequent mode transitions for run-time leakage power reduction. In this paper, a semiempirical model for virtual supply voltage in terms of basic parameters of the power-gated circuit is presented. Hence a closed-form expression for estimation of wakeup time of a power-gated...
Current mode (CM) scheme provides suitable alternative for the high speed on-chip interconnect signaling. This paper presents a energy-delay optimization methodology for the current-mode (CM) signaling scheme. Optimization for the CM circuits for on-chip interconnects requires a joint optimization of driver and receiver device sizes, as their parameters which affect the energy-delay performance depend...
For several decades, the output from semiconductor manufacturers has been high volume products with process optimisation being continued throughout the lifetime of the product to ensure a satisfactory yield. However, product lifetimes are continually shrinking to keep pace with market demands. Furthermore there is an increase in dasiafoundrypsila business where product volumes are low; consequently...
The challenges of deriving early-adopter competitive advantage, even with fabless access to process technology, through leveraging features offered by the advanced, and possibly disruptive, process technologies in real SoC products, are outlined. A structured methodology for addressing these challenges, and bridging the gap between process and design, sufficiently early in the development cycle to...
We present a generic method for analyzing the effect of process variability in nanoscale circuits. The proposed framework uses kernel and a generic tail probability estimator to eliminate the need for a-priori density choice for the nature of circuit variation. This allows capturing the true nature of the circuit variation from a few random samples of its observed responses. The data-driven, non-parametric,...
The dramatic increase in leakage current, coupled with the swell in process variability in nano-scaled CMOS technologies, has become a major issue for future IC design. Moreover, due to the spread of leakage power values, leakage variability cannot be neglected anymore. In this work an accurate analytic estimation and modeling methodology has been developed for logic gates leakage under statistical...
A novel approach for performance estimation is described which gives the designer access to the design space boundaries of a circuit topology so that the tradeoff analysis of competing performances can be evaluated by optimum design points and Pareto curves with an acceptable execution time and transistor-level accuracy can be obtained. Recently, there is a strong emphasis on numerical techniques...
This paper describes the integration of a new tool for testability measurement and improvement into a design system for integrated circuits. The involved design system, CADDY (Carlsruhe Digital Design System), uses a functional description of a circuit written in a PASCAL like language and synthesizes a list of nets and real logical components. In this resulting structure all storing elements are...
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