Search results
IEEE Transactions on Power Electronics > 2018 > 33 > 3 > 1985 - 1996
IEEE Transactions on Power Electronics > 2018 > 33 > 3 > 2704 - 2713
IEEE Transactions on Industrial Electronics > 2018 > 65 > 2 > 1675 - 1684
IEEE Electron Device Letters > 2018 > 39 > 1 > 4 - 7
IEEE Journal of Photovoltaics > 2018 > 8 > 1 > 189 - 195
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 142 - 149
IEEE Electron Device Letters > 2018 > 39 > 1 > 35 - 38
IEEE Electron Device Letters > 2018 > 39 > 1 > 8 - 11
IEEE Transactions on Industrial Electronics > 2018 > 65 > 1 > 412 - 423
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 683 - 691
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 12 > 2079 - 2086
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 727 - 737
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 653 - 666
IEEE Transactions on Reliability > 2017 > 66 > 4 > 989 - 996
IEEE Transactions on Power Electronics > 2017 > 32 > 12 > 9435 - 9446
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3138 - 3151
IEEE Transactions on Power Electronics > 2017 > 32 > 11 > 8718 - 8727
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 10 > 1634 - 1643
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3748 - 3755
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3639 - 3646