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IEEE Transactions on Electron Devices > 2010 > 57 > 1 > 108 - 118
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 323 - 331
IEEE Transactions on Electron Devices > 2010 > 57 > 1 > 108 - 118
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 323 - 331